(For USM Staff/Student Only)

EngLib USM > @i* Standard > British Standard >

PD 6598:1996 - Measurement techniques for the characterization of the European mini test chip

Printed version of this is available at library. To request, please e-mail to referencepk@usm.my and include a copy of this record in your e-mail.
To obtain detailed information about PD 6598:1996, you should check with the British Standards Institution (BSI), which is responsible for publishing and maintaining British Standards. Contacting BSI directly through their official website or customer service would be the best way to access the specific content of this standard. If you are involved in a specific industry or research area related to mini test chips and characterization, you may also want to check with relevant professional associations or organizations in that field, as they may have additional information or resources.
Contributor(s):
NAAR - Data Entry Person
Primary Item Type:
British Standard
Identifiers:
ICS 31.200 Integrated circuits. Microelectronics
ISBN 0580258041
Language:
English
Subject Keywords:
Metal oxide semiconductors; Digital integrated circuits; Dimensional measurement; Frequency measurement; Transistors; Capacitance measurement; Thickness measurement; Current measurement; Electrical measurement; Microprocessor chips; Capacitors
First presented to the public:
1/30/2024
Original Publication Date:
7/15/1996
Previously Published By:
British Standards Institution
Place Of Publication:
London, United Kingdom
Citation:
Extents:
Number of Pages - 23
License Grantor / Date Granted:
  / ( View License )
Date Deposited
2024-01-30 10:28:24.389
Submitter:
Nurul Aini Abdul Rahman

All Versions

Thumbnail Name Version Created Date
PD 6598:1996 - Measurement techniques for the characterization of the European mini test chip1 2024-01-30 10:28:24.389
Engineering Library USM @ 2017