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PD 6595:1996 - Parameter extraction techniques for the European mini test chip

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Contributor(s):
NAAR - Data Entry Person
Primary Item Type:
British Standard
Identifiers:
ISBN 0580256049
ICS 31.200 Integrated circuits. Microelectronics
Language:
English
Subject Keywords:
Electronic equipment and components; Integrated circuits; Metal oxide semiconductors; Transistors; Test equipment; Digital integrated circuits; Microprocessor chips
First presented to the public:
1/30/2024
Original Publication Date:
5/15/1996
Previously Published By:
British Standards Institution
Place Of Publication:
London, United Kingdom
Citation:
Extents:
Number of Pages - 32
License Grantor / Date Granted:
  / ( View License )
Date Deposited
2024-01-30 10:27:45.352
Submitter:
Nurul Aini Abdul Rahman

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