BS 2011-2.1J:1989 - Basic environmental testing. Tests - Test J and guidance. Mould growth
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Applies to electronic components, materials, and equipment exposed to humid or mould-prone environments.
Used in industries such as aerospace, defense, telecommunications, and consumer electronics.
Purpose:
Determines the susceptibility of materials to fungal growth.
Assesses potential degradation of mechanical, electrical, or optical properties due to mould exposure.
Test Conditions:
Exposes test specimens to controlled temperature, humidity, and fungal spores.
Evaluates growth over a specific period to measure resistance.
Guidance Provided:
Selection of appropriate test methods.
Interpretation of results based on visual inspection, mechanical performance, and material integrity.
This standard helps manufacturers ensure their products are resistant to fungal contamination, improving reliability in high-humidity environments.