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BS EN 120000:1996 - Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices

Current
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Unless otherwise stated, a production lot (referred to as "lot")consists of devices having the same design, manufactured on the sameproduction line, only differing by a selection based on electrical and optical characteristic limits, and normally produced during one week.
Contributor(s):
NAAR - Data Entry Person
Primary Item Type:
British Standard
Identifiers:
ISBN  0580261999
ICS 31.260 Optoelectronics. Laser equipment
Language:
English
Subject Keywords:
Inspection; Performance testing; Voltage measurement; Semiconductor devices; Light-emitting diodes; Electronic equipment and components; Mechanical testing; Optical measurement; Quality assurance systems; Verification; Marking; Light-emitting devices; Phototransistors; Defects; Quality control; Approval testing; Designations; Couplers; Circuits; Capability approval; Light distribution; Test equipment; Electrical measurement; Visual inspection (testing); Specification (approval); Handbooks; Sampling methods; Resistance measurement; Current measurement; Assessed quality; Liquid crystal devices; Environmental testing; Statistical quality control; Optoelectronic devices; Qualification approval; Electrical testing; Testing conditions; Endurance testing; Photodiodes; Detail specification
First presented to the public:
6/21/2023
Original Publication Date:
9/15/1996
Previously Published By:
British Standards Institution
Place Of Publication:
London, United Kingdom
Citation:
Extents:
Number of Pages - 268
License Grantor / Date Granted:
  / ( View License )
Date Deposited
2023-06-21 08:16:43.223
Submitter:
Nurul Aini Abdul Rahman

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