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Effect of pH on tungsten removal from chemical mechanical polishing (cmp) slurry using dowex marathon c resin of ion exchang

Effect of pH on tungsten removal from chemical mechanical polishing (cmp) slurry using dowex marathon c resin of ion exchang / Nur Husni Ahmad
Buburan proses pengilatan kimia digukan secara menyeluruh di dalam industri semikonduktor sebagai agen penggilap untuk meratakan permukaan wafer. Proses penggilapan ini membabitkan tindakan kimia dan mekanikal untuk menyingkirkan lapisan logam yang telah terjejas di atas permukaan wafer dengan menggunakan buburan tungsten. Pemulihan terhadap buburan tungsten ini amat penting untuk mengurangkan kos operasi seterusnya mengurangkan jumlah pengeluaran air sisa daripada industri. Oleh itu, kajian terhadap pemulihan terhadap buburan tungsten telah dijalankan menggunakan kaedah pertukaran ion iaitu dengan menggunakan kation resin secara spesifiknya. Kation resin yang digunakan ini tergolong dalam kumpulan pertukaran kation asid kuat iaitu Dowex Marathon C resin. Faktor yang dipertimbangkan dalam kajian ini adalah perbezaan pH oleh buburan tungsten terpakai. Kajian terhadap karakter buburan tungsten sangat penting untuk memahami metod yang terbaik untuk pemulihan buburan tungsten tersebut. Oleh itu, beberapa kajian terhadap karakter buburan tungsten telah dilakukan iaitu meliputi pH, kandungan logam, konduktiviti, zeta berpotensi dan juga purata saiz partikel di mana perubahan pH akan mempengaruhi semua aspek di atas. pH yang digunakan semasa kajian adalah 3.84, 5.26, 8.50 dan juga 10.84 dengan jumlah resin sebanyak 5 g, isipadu buburan tungsten terpakai sebanyak 150 mL dan masa campuran selama 120 minit. Oleh itu, rumusan daripada kajian ini mendapati bahawa penyingkiran tungsten berlaku lebih efisien pada pH yang berasid iaitu 9.70% penyingkiran di pH 3.84 berbanding penyingkiran ferum yang terbaik berlaku pada pH 10.84 dengan peratus penyingkiran sebanyak 39.49%. _______________________________________________________________________________________________________ The chemical mechanical polishing slurry is widely used in the semiconductor industry as a polishing agent to polish the surface of wafer. The polishing process involve the chemical and mechanical action to remove the modified layer on the surface of the wafer by tungsten slurry. The recovery of the tungsten slurry is important to help reducing the cost of operation and reduce the production of wastewater by the industry. The recovery of spent tungsten slurry is study by using the ion exchange process by using the cation resin. Cation resin used is classified as strong acid cation exchange which is the Dowex Marathon C resin. The parameter that consider in this study is the pH different of the spent tungsten slurry. The study on the characterization of the tungsten slurry is vital to understand the best recovery method for the tungsten slurry. The study of characterization of tungsten slurry involve the pH, metal content, conductivity, zeta potential and mean particle size where the change in pH of slurry will affected the conductivity, zeta potential and mean particle size of the slurry. The pH used in this study is 3.84, 5.26, 8.50 and 10.84 with amount of resin used is 5g, volume of spent slurry is 150 mL and time contact between resin and slurry is 120 minutes. As a conclusion, the removal of tungsten showed that the best removal in the acidic pH with 9.70% removal at pH 3.84 and the iron removal from slurry showed that the best removal is when the pH is alkali with 39.49% at pH 10.84.
Contributor(s):
Nur Husni Ahmad - Author
Primary Item Type:
Final Year Project
Identifiers:
Accession Number : 875007554
Language:
English
First presented to the public:
6/1/2018
Original Publication Date:
7/18/2018
Previously Published By:
Universiti Sains Malaysia
Place Of Publication:
School of Chemical Engineering
Citation:
Extents:
Number of Pages - 56
License Grantor / Date Granted:
  / ( View License )
Date Deposited
2018-07-18 12:58:06.121
Date Last Updated
2019-01-07 11:24:32.9118
Submitter:
Mohd Jasnizam Mohd Salleh

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Effect of pH on tungsten removal from chemical mechanical polishing (cmp) slurry using dowex marathon c resin of ion exchang1 2018-07-18 12:58:06.121