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BS 7681-5:1995 Measurement of quartz crystal unit parameters - Part 6. Measurement of drive level dependence (DLD)

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This part of IEC 444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods are described. Method A, based on the T-network method according to IEC 444-1, can be used in the complete frequency range covered by this part of IEC 444. Method B, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
Primary Item Type:
British Standard
Identifiers:
ISBN 0580244806
Language:
English
Subject Keywords:
Quartz crystal; drive level dependence (DLD); Quartz crystal units; Quartz crystal resonators; Linear equivalent circuits;
First presented to the public:
11/9/2022
Original Publication Date:
11/15/1995
Previously Published By:
British Standards Institution
Place Of Publication:
London, United Kingdom
Citation:
Extents:
Number of Pages - 13
License Grantor / Date Granted:
  / ( View License )
Date Deposited
2022-11-09 10:42:33.766
Submitter:
Muhamad Azmil Ramli

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BS 7681-5:1995 Measurement of quartz crystal unit parameters - Part 6. Measurement of drive level dependence (DLD)1 2022-11-09 10:42:33.766
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