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BS EN 190000:1996 - Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits

Description Printed version of this is available at library. To request, please e-mail to referencepk@usm.my and include a copy of this record in your e-mail. Abstract This specification specifies the terms, definitions, symbols, test methods and other material for monolithic integrated (micro)circuits (*), as defined in IEC 747, necessary to prepare appropriate detail specifications (DS) in the CECC System. Supplementary requirements for different families of integrated microcircuits are included in separate specifications.

Contributor(s): NAAR - Data Entry Person Primary Item Type: British Standard Identifiers: ISBN  0580252116 ICS  31.200 Integrated circuits. Microelectronics Language: English Subject Keywords: Dimensions; Accelerated testing; Capability approval; Circuits; Defects; Solderability testing; Symbols; Assessed quality; Surface defects; Endurance testing; Specification (approval); Approval testing; Thermal testing; Electronic equipment and components; Quality control; Quality assurance systems; Marking; Test specimens; Vibration testing; Damp-heat tests; Environmental testing; Monolithic integrated circuits; Acceleration tests; Integrated circuits; Electrical testing; Formulae (mathematics); Testing conditions; Definitions; Visual inspection (testing); Impact testing; Inspection; Qualification approval; Detail specification; Orientation; Mechanical testing; Leak tests First presented to the public: 7/5/2023 Original Publication Date: 3/15/1996 Previously Published By: British Standards Institution Place Of Publication: London, United Kingdom Citation: Extents: Number of Pages - 262 License Grantor / Date Granted:   / ( View License ) Date Deposited 2023-07-05 09:40:13.212 Submitter: Nurul Aini Abdul Rahman

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