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MS IEC 61180-2:2010 - High- Voltage Test Techniques For Low-Voltage Equipment- Part 2: Test Equipment (IEC 61180-2:1994, IDT)

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This part of IEC 1180 is applicable to the test equipment used for dielectric tests on low-voltage equipment. It covers tests with direct, alternating or impulse voltage, impulse current, and tests with a combination of impulse voltage and impulse current. Verification procedures necessary for ensuring that the dielectric tests comply with the voltage, or current, requirements stated in part 1 of this standard in shape and magnitude are stated. The test equipment comprises a voltage and/or current generator and a measuring system. This standard covers test equipment in which the measuring system is protected against external interference and coupling by appropriate screening, for example a continu- ous conducting shield. Therefore, simple comparison tests are sufficient to ensure valid results. Test equipment having measuring systems composed of non-screened components and/or connected by long leads is not covered in this standard. In this case guidance can be obtained from IEC 60-2 keeping in mind the less stringent requirements of this standard.
Contributor(s):
NAAR - Data Entry Person
Primary Item Type:
Malaysian Standard
Identifiers:
ICS 19.080
Language:
English
First presented to the public:
1/17/2024
Original Publication Date:
1/1/2010
Previously Published By:
Department of Standards Malaysia
Place Of Publication:
Malaysia
Citation:
Extents:
Number of Pages - 19
License Grantor / Date Granted:
  / ( View License )
Date Deposited
2024-01-17 10:58:40.841
Date Last Updated
2024-01-22 11:24:04.615
Submitter:
Nurul Aini Abdul Rahman

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MS IEC 61180-2:2010 - High- Voltage Test Techniques For Low-Voltage Equipment- Part 2: Test Equipment (IEC 61180-2:1994, IDT)1 2024-01-17 10:58:40.841