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Characterization and behaviour of silicon dioxide nanoparticles in chemical mechanical polishing wastewater with the presence of ferrous sulphate and polyaluminium chloride

Characterization and behaviour of silicon dioxide nanoparticles in chemical mechanical polishing wastewater with the presence of ferrous sulphate and polyaluminium chloride / Sin Jing Yao
Pada abad ke dua puluh satu, industri semikonduktor adalah salah satu industri pembuatan yang paling berdaya saing di seluruh seluruh dunia. Keadaan ini disebabkan permintaan semikonduktor yang tinggi daripada pembuatan alat-alat elektronik yang berteknologi tinggi. Walaupun terdapat banyak wafer dan cip yang dihasilkan setiap hari oleh pihak industri, namun kesedaran pentingnya menjaga alam sekitar menjadi semakin rendah dalam kalangan masyarakat. Oleh kerana pengeluaran semikonduktor semakin meningkat setiap tahun, sisa air semikonduktor yang dijana daripada pengeluaran juga meningkat. Untuk mengelakkan sisa air semikonduktor terus mengalir ke alam sekitar, banyak bahan pengental digunakan untuk merawat sisa air semikonduktor. Walau bagaimanapun, sisa air semikonduktor tidak dapat rawat sepenuhnya kerana masih ada sisa dalam skala nano tertinggal dalam sisa air. Dalam kajian ini, potensi zeta dan saiz zarah air sisa semikonduktor menjadi tumpuan untuk memerhati perubahan ciri-ciri ini dengan nilai pH yang berbeza. Tujuan kajian memerhati sikap potensi zeta dan saiz zarah adalah untuk menambah pemahaman yang lebih baik mengenai mekanisme penggumpalan. Tambahan pula, sulfat ferus dan poly-aluminium digunakan sebagai bahan pengental dalam kajian ini untuk menyiasat bagaimana potensial zeta dan zarah saiz sisa air sisa semikonduktor berubah semasa bahan pengental ditambah. Berdasarkan keputusan kajian, poly-aluminium adalah koagulan yang dapat meneutralkan potensial zeta untuk sisa air semikonduktor pada 30 mg/L. Bagi ferus sulfat, ia tidak berkesan seperti poly-aluminium di mana nilai potensi zeta lebih rendah dan saiz zarah tidak berubah. Kesimpulannya, poly-aluminium mempunyai potensi yang lebih baik untuk merawat sisa air semikonduktor berbanding dengan ferus sulfat. _______________________________________________________________________________________________________ In the twenty-first century, semiconductor industry is one of the most competitive manufacturing industries around worldwide. This is due to high demand of semiconductor for the manufacturing of electronic devices in this high technology era. While there are many wafers and chips produced daily from the industries, it seems the awareness of people to the environment become lesser among the society. As more semiconductors produced throughout every year, the chemical mechanical polishing (CMP) wastewater generated from the output also increased. In order to prevent the CMP wastewater directly flow into the environment, there are many coagulants and methods done to treat the CMP wastewater. However, the CMP wastewater is always to purify at the best condition as there are some residue in nano-scale still left in the wastewater. In this study, zeta potential and particle size of CMP wastewater are concerned to observe how these characteristics behave along different pH value. The purpose for study of behaviour of zeta potential and particle size is to have a better understanding on the coagulation mechanism. Furthermore, ferrous sulphate and poly-aluminium are used as coagulant in this study to investigate how zeta potential and particle size of CMP wastewater behave as coagulants are added. Based on the results, poly-aluminium is an effective coagulant which able to neutralize the zeta potential of CMP wastewater at 30 mg/L. However, ferrous sulphate does not as much effective as poly-aluminium where zeta potential is slightly lower while particle sizes are remained constant. In conclusion, poly-aluminium has better potential to treat CMP wastewater compare to ferrous sulphate.
Contributor(s):
Sin Jing Yao - Author
Primary Item Type:
Final Year Project
Identifiers:
Accession Number : 875006864
Barcode : 00003106741
Language:
English
Subject Keywords:
semiconductor industry; electronic devices; CMP
First presented to the public:
6/1/2017
Original Publication Date:
3/20/2018
Previously Published By:
Universiti Sains Malaysia
Place Of Publication:
School of Civil Engineering
Citation:
Extents:
Number of Pages - 97
License Grantor / Date Granted:
  / ( View License )
Date Deposited
2018-03-20 16:28:39.574
Date Last Updated
2020-05-15 14:54:23.498
Submitter:
Mohd Jasnizam Mohd Salleh

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Characterization and behaviour of silicon dioxide nanoparticles in chemical mechanical polishing wastewater with the presence of ferrous sulphate and polyaluminium chloride1 2018-03-20 16:28:39.574